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|Author(s):||Hongki Min; Shaffique Adam; Young J. Song; Joseph A. Stroscio; Mark D. Stiles; Allan H. MacDonald;|
|Title:||Landau Levels and Band Bending in Few-Layer Epitaxial Graphene|
|Published:||April 18, 2011|
|Abstract:||The carrier density distributions in few-layer-graphene systems grown on the carbon face of silicon carbide can be radically altered by the presence of a Scanning Tunneling Microscope (STM) tip used to probe top-layer electronic properties, and by a perpendicular magnetic field which induces well-defined Landau levels. Hartree approximation calculations in the perpendicular field case show that charge tends to rearrange between the layers so that the filling factors of most layers are pinned at integer values. We use our analysis to provide insight into the role of buried layers in recent few-layer-graphene STM studies and discuss the limitations of our model.|
|Citation:||Physical Review B|
|Research Areas:||Nanophysics, Electron Physics|
|PDF version:||Click here to retrieve PDF version of paper (561KB)|