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|Author(s):||Christopher J. Kiely; Andrew A. Herzing;|
|Title:||Imaging and Micronaylsis of Supported Metal Catalysts in the Analytical Electron Microscope|
|Published:||December 01, 2011|
|Abstract:||The modern analytical electron microscope (AEM) is a powerful and versatile tool for the characterization of supported metal catalysts. The combination of atomic resolution images with chemical sensitivity at comparable length scales via X-ray energy dispersive spectroscopy (XEDS) and electron energy-loss spectroscopy (EELS) is ideally suited to elucidating the nature of the active sites within such materials. In this chapter, an overview of the imaging and spectroscopic signals is undertaken, with a particular emphasis on their application to supported metal catalysts.|
|Citation:||Supported Metals in Catalysis, 2nd edition, James A. Anderson and Marcos Fernandez, Garcia (editors), ICP Press|
|Publisher:||Imperial College Press, London, -1|
|Pages:||pp. 81 - 120|
|Keywords:||catalysis, STEM, TEM, AEM, EELS, EFTEM, XEDS, microanalysis, microscopy|