Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Tam H. Duong; Allen R. Hefner Jr.; Karl Hobart; Sei-Hyung Ryu; David Grider; David W. Berning; Jose M. Ortiz; Eugene Imhoff; Jerry Sherbondy;|
|Title:||Comparison of 4.5 kV SiC JBS and Si PiN Diodes for 4.5 kV Si IGBT Anti-parallel Diode Applications|
|Published:||March 10, 2011|
|Abstract:||A new 60 A, 4.5 kV SiC JBS diode is presented and its performance is compared to Si PiN diodes used as the anti-parallel diode for 4.5 kV Si IGBTs. The current-voltage, capacitance-voltage, reverse recovery, and reverse leakage characteristics of both diode types are measured using recently developed high-voltage, high-frequency device test systems. The devices are also characterized as the anti-parallel diode for a 4.5 kV Si IGBT using a recently developed high-voltage, high-frequency double-pulse switching test system. The results indicates that the SiC JBS diodes are far superior to the Si PiN diodes, resulting in an order of magnitude less switching loss and substantially less current spike stress. Validated models are also developed for the 4.5 kV SiC JBS diode and Si PiN diode.|
|Conference:||APEC 2011 (The Applied Power Electronics Conference and Exposition)|
|Proceedings:||Proceedings of the Applied Power Electronics Conference and Exposition 2011|
|Location:||Fort Worth, TX|
|Dates:||March 6-10, 2011|
|Keywords:||Silicon Carbide, medium-voltage, high-frequency, Junction Barrier Schottky (JBS), hybrid half-bridge module, power systems.|
|PDF version:||Click here to retrieve PDF version of paper (1MB)|