Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Jason P. Killgore; Roy H. Geiss; Donna C. Hurley;|
|Title:||In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy|
|Published:||March 15, 2011|
|Abstract:||Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes in contact radius is directly detected in situ. We find that in-situ results agree well with existing ex-situ techniques, while providing additional robust wear information that would not be resolved ex situ. Additionally, we find that CR-FM mapping does not affect the wear mechanism compared to standard contact scanning.|
|Pages:||pp. 1018 - 1022|
|Keywords:||Contact Resonance Force Microscopy, Atomic Force Microscope, Tip Wear, tribology, nanotribology|
|Research Areas:||Characterization, Nanometrology, and Nanoscale Measurements, Atomic force microscopy (AFM)|
|PDF version:||Click here to retrieve PDF version of paper (586KB)|