| Author(s): |
Jason P. Killgore; Roy H. Geiss; Donna C. Hurley; |
| Title: |
In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy |
| Published: |
March 15, 2011 |
| Abstract: |
Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes in contact radius is directly detected in situ. We find that in-situ results agree well with existing ex-situ techniques, while providing additional robust wear information that would not be resolved ex situ. Additionally, we find that CR-FM mapping does not affect the wear mechanism compared to standard contact scanning. |
| Citation: |
Small |
| Pages: |
pp. 1018 - 1022 |
| Keywords: |
Contact Resonance Force Microscopy; Atomic Force Microscope; Tip Wear; tribology; nanotribology |
| Research Areas: |
Characterization, Nanometrology, and Nanoscale Measurements, Atomic force microscopy (AFM) |
| PDF version: |
 Click here to retrieve PDF version of paper (572KB) |
