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Publication Citation: In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy

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Author(s): Jason P. Killgore; Roy H. Geiss; Donna C. Hurley;
Title: In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published: March 15, 2011
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes in contact radius is directly detected in situ. We find that in-situ results agree well with existing ex-situ techniques, while providing additional robust wear information that would not be resolved ex situ. Additionally, we find that CR-FM mapping does not affect the wear mechanism compared to standard contact scanning.
Citation: Small
Pages: pp. 1018 - 1022
Keywords: Contact Resonance Force Microscopy; Atomic Force Microscope; Tip Wear; tribology; nanotribology
Research Areas: Characterization, Nanometrology, and Nanoscale Measurements, Atomic force microscopy (AFM)
PDF version: PDF Document Click here to retrieve PDF version of paper (586KB)