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Conductive Nanotube-based Scanning Probe Microscopy Applications

Published

Author(s)

Paul McClure, Vladimir Mancevski, Joseph Kopanski, Ilona Sitnitsky, Vincent LaBella, Kathleen Dunn, Matthew D. Bresin, Phillip D. Rack, Victor H. Vartanian
Citation
International SEMATECH Manufacturing Initiative Confidential

Citation

McClure, P. , Mancevski, V. , Kopanski, J. , Sitnitsky, I. , LaBella, V. , Dunn, K. , Bresin, M. , Rack, P. and Vartanian, V. (2010), Conductive Nanotube-based Scanning Probe Microscopy Applications, International SEMATECH Manufacturing Initiative Confidential, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907145 (Accessed March 28, 2024)
Created June 29, 2010, Updated October 14, 2021