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Publication Citation: Conductive Nanotube-based Scanning Probe Microscopy Applications

NIST Authors in Bold

Author(s): Paul McClure; Vladimir Mancevski; Joseph J. Kopanski; Ilona Sitnitsky; Vincent LaBella; Kathleen Dunn; Matthew D. Bresin; Phillip D. Rack; Victor H. Vartanian;
Title: Conductive Nanotube-based Scanning Probe Microscopy Applications
Published: June 30, 2010
Abstract:
Citation: International SEMATECH Manufacturing Initiative Confidential
Pages: 52 pp.
Research Areas: Carbon Nanotubes