Publication Citation
NIST Authors in Bold
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| Author(s): | LC Teague; Oana Jurchescu; Curt A. Richter; Sankar Subramanian; John E. Anthony; Thomas Jackson; David J. Gundlach; James G. Kushmerick; |
|---|---|
| Title: | Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy |
| Published: | June 23, 2010 |
| Abstract: | |
| Pages: | 30 pp. |
| Research Areas: | Nanoelectronics and Nanoscale Electronics |