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Publication Citation: Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy

NIST Authors in Bold

Author(s): LC Teague; Oana Jurchescu; Curt A. Richter; Sankar Subramanian; John E. Anthony; Thomas Jackson; David J. Gundlach; James G. Kushmerick;
Title: Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: June 23, 2010
Abstract:
Pages: 30 pp.
Research Areas: Nanoelectronics and Nanoscale Electronics