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Publication Citation: Electrical and Thermal Characterization, Modeling, and Reliability Assessment of Power Semiconductor Modules

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Author(s): Allen R. Hefner Jr;
Title: Electrical and Thermal Characterization, Modeling, and Reliability Assessment of Power Semiconductor Modules
Published: October 28, 2009
Abstract:
Pages: 3 pp.
Research Areas: U.S. Measurement System, Electric Power Metrology, Energy Conversion, Storage, and Transport