Publication Citation
NIST Authors in Bold
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| Author(s): | Allen R. Hefner Jr; |
|---|---|
| Title: | Electrical and Thermal Characterization, Modeling, and Reliability Assessment of Power Semiconductor Modules |
| Published: | October 28, 2009 |
| Abstract: | |
| Pages: | 3 pp. |
| Research Areas: | U.S. Measurement System, Electric Power Metrology, Energy Conversion, Storage, and Transport |