Publication Citation
NIST Authors in Bold
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| Author(s): | Nhan V. Nguyen; Oleg A. Kirillov; John S. Suehle; |
|---|---|
| Title: | Band Alignment of Metal-Oxide-Semiconductor Structure by Internal Photoemission Spectroscopy and Spectroscopic Ellipsometry |
| Published: | May 28, 2010 |
| Abstract: | |
| Pages: | 30 pp. |
| Research Areas: | Thin-Films, Semiconductor Materials |