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Publication Citation: Band Alignment of Metal-Oxide-Semiconductor Structure by Internal Photoemission Spectroscopy and Spectroscopic Ellipsometry

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Author(s): Nhan V. Nguyen; Oleg A. Kirillov; John S. Suehle;
Title: Band Alignment of Metal-Oxide-Semiconductor Structure by Internal Photoemission Spectroscopy and Spectroscopic Ellipsometry
Published: May 28, 2010
Abstract:
Pages: 30 pp.
Research Areas: Thin-Films, Semiconductor Materials