NIST Authors in Bold
| Author(s): | Samuel M. Stavis; Jon C. Geist; Michael Gaitan; |
|---|---|
| Title: | Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion |
| Published: | August 01, 2010 |
| Abstract: | |
| Conference: | Washington Metro Region Nanotechnology Partnership Forum at NIST |
| Volume: | 10 |
| Pages: | pp. 2618 - 2621 |
| Location: | Gaithersburg, MD |
| Dates: | September 13, 2010 |
| Research Areas: | Nanoparticles, Nanofluidics, Nanofabrication, Nanomanufacturing, and Nanoprocessing, Nanotechnology |