NIST logo

Publication Citation: Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks

NIST Authors in Bold

Author(s): Mark C. Strus; Ann C. Chiaramonti Debay; Robert R. Keller; Yung J. Jung; Younglae Kim;
Title: Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks
Published: May 18, 2011
Abstract: We present test methods to investigate the electrical reliability of nanoscale lines of highly-aligned, networked, metallic/semiconducting single-walled carbon nanotubes (SWCNTs) fabricated through a template-based fluidic assembly process. We find that these SWCNT networks can withstand DC current densities larger than 10 MA/cm2 for several hours and in some cases several days. We observed that the failure rate, failure predictability, and total device lifetime depend on the initial resistance. Scanning electron and transmission electron microscopy suggested that fabrication variability plays a critical role in rate of failure and we offer a method of quickly screening whether networks will have sufficient performance lifetimes. We found that well-fabricated lines subjected to constant electrical stress show a linear accumulation of damage reminiscent of electromigration in metallic interconnects and we explore which underlying physical mechanisms could cause such behavior.
Citation: Nanotechnology
Pages: 9 pp.
Keywords: single walled carbon nanotube networks, films; bundles, and arrays; electrical reliability measurements; nanoscale interconnects; flexible electronics; photovoltaics; transistors; sensors
Research Areas: Reliability, Carbon Nanotubes, Nanoelectronics and Nanoscale Electronics, Nanomaterials, Measurement Needs
PDF version: PDF Document Click here to retrieve PDF version of paper (1MB)