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|Author(s):||Ryan G. Brennan; Therese A. Butler; Michael R. Winchester;|
|Title:||Achieving 0.2 % Relative Expanded Uncertainty in Ion Chromatography Analysis using a High-Performance Methodology|
|Published:||April 12, 2011|
|Abstract:||A high-performance (HP) technique that was originally developed for inductively coupled plasma optical emission spectrometry (ICP-OES) has been successfully translated to ion chromatography (IC) to enable analyses with extremely low uncertainty. As an example application of the HP-IC methodology, analyses of several National Institute of Standards and Technology (NIST) Standard Reference Materials (SRMs) in the SRM 3180 series of anion standard solutions are reported. The relative expanded uncertainty values expressed at 95 % confidence for these analyses range from 0.087 % to 0.27 % and average 0.18 %. Strong correlation between analyte and internal standard anion peak heights or peak areas, as well as the use of a unique drift-correction approach, is shown to be important for attaining such low uncertainty.|
|Pages:||pp. 3801 - 3807|
|Keywords:||high-performance (HP), ion chromatography (IC), low uncertainty, anion SRM|
|Research Areas:||Inorganic Analytical Chemistry|
|PDF version:||Click here to retrieve PDF version of paper (151KB)|