| Author(s): |
Jan Obrzut; Bernd Schumacher; Heinz-Gunter Bach; Petra Spitzer; |
| Title: |
Springer Handbook of Metrology and Testing, Electrical Properties |
| Published: |
August 01, 2011 |
| Abstract: |
The dielectric properties of materials are used to describe electrical energy storage, dissipation and energy transfer. The most relevant physical processes in dielectric materials from the practical view point are those which result in power loss. Molecular solids, organic polymer resins, ceramic glasses and composites of organic resins with ceramic fillers represent typical dielectrics. It is important to understand the basic characteristics of these processes because they determine the optimal approach to measurement. In this book chapter we review the basic characteristics of the dielectric materials and the methods for permittivity measurements. Recent advances in high frequency metrology employing microwave network analysis is highlighted for bulk and thin-film materials. |
| Citation: |
Springer Handbook Handbook of Metrology and Testing |
| Publisher: |
Springer, Heidelberg, -1 |
| Pages: |
pp. 485 - 540 |
| Keywords: |
electrical properties; dielectric metrology; high frequency measurements |
| Research Areas: |
Materials Science, Measurements |
| PDF version: |
 Click here to retrieve PDF version of paper (13MB) |
