| Author(s): |
John A. Horst; Nathan Hartman; George Wong; |
| Title: |
Metrics for the Cost of Proprietary Information Exchange Languages in Intelligent Systems |
| Published: |
January 31, 2011 |
| Abstract: |
The increasing number of intelligent software components is accompanied by an increase of proprietary information exchange languages between components. One of the challenges for the smart technology worker is to achieve intelligent system component interoperability, at the lowest cost possible, without sacrificing the freedom to choose from the entire spectrum of current and future software product offerings. This is best achieved when correct, complete, and unambiguous information exchange standards are implemented in vendor products worldwide. If this is the common sense solution to information incompatibility costs and risks, why is standards-based interoperability so rarely seen? One reason is that a required investment in standards must precede the savings gotten from true interoperability. Corporate management is commonly reluctant to commit to this investment, partly because there appears to be no published set of interoperability cost metrics which technology workers can employ to make a better business case. This research seeks to remedy this situation by defining realistic, comprehensive, and sector-independent cost-risk metrics. |
| Proceedings: |
Proceedings of the 2010 Performance Metrics for Intelligent Systems (PerMIS) Workshop |
| Pages: |
pp. 82 - 86 |
| Location: |
Baltimore, MD |
| Dates: |
September 28-30, 2010 |
| Keywords: |
Interoperability; information; information exchange languages; intelligent systems; intelligent system components; return on investment; standards; information exchange standards; standard languages; interoperability costs; metrics; interoperability metrics; interoperability cost metrics; interoperability risk metrics; proprietary exchange languages |
| Research Areas: |
Software Testing Metrics, Quality Systems, Documentary Standards, Standards, Information Technology, Manufacturing, Quality |
| PDF version: |
 Click here to retrieve PDF version of paper (279KB) |
