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|Author(s):||Edwin P. Chan; Santanu S. Kundu; Qinhuang Lin; Christopher M. Stafford;|
|Title:||Thickness effect on the viscoelastic properties of polystyrene thin films as measured by thermal wrinkling|
|Published:||December 29, 2010|
|Abstract:||The viscoelastic properties of polymer thin films can have a significant impact on the performance in many small-scale devices. In this work, we use thermal wrinkling, which is a phenomenon based on a thermally-initiated instability, to measure viscoelastic properties of a polymer thin film as a function of thickness. By monitoring the time-evolved wrinkle wavelength at fixed annealing temperatures, we can infer the stress-relaxation modulus and relaxation time of a polystyrene film as a function of film thickness with the aid of the appropriate buckling mechanics models. Specifically, we are able to identify the rubbery plateau and viscous flow regions as a function of annealing time and temperature above its glass transition. For the polystyrene films investigated, we find that the stress relaxation modulus is thickness-independent for films above 100 nm, while a slight deviation was observed below 100 nm.|
|Citation:||ACS Applied Materials and Interfaces|
|Pages:||pp. 331 - 338|
|Keywords:||polymer, viscoelasticity, thin films, coatings, instabilities, wrinkling|
|Research Areas:||Polymers, Nanomechanics, Characterization, Materials Science, Measurements|
|PDF version:||Click here to retrieve PDF version of paper (4MB)|