Publication Citation
NIST Authors in Bold
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| Author(s): | John V. Reichl; David W. Berning; Allen R. Hefner Jr; Jih-Sheng Lai; |
|---|---|
| Title: | Six-Pack IGBT Dynamic Electro-Thermal Model; Parameter Extraction and Validation |
| Published: | February 02, 2004 |
| Abstract: | |
| Conference: | 2004 IEEE Applied Power Electronics Conference |
| Proceedings: | Proceedings of the 2004 IEEE Applied Power Electronics Conference |
| Pages: | 6 pp. |
| Location: | -1 |
| Research Areas: | Electric Power Metrology |
| PDF version: |  Click here to retrieve PDF version of paper (2MB) |