Publication Citation
NIST Authors in Bold
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| Author(s): | Safak Sayan; Robert A. Bartynski; Xin Zhao; Evgeni Gusev; David V. Vanderbilt; Mark Croft; M M. Banaszak-Holl; Eric Garfunkel; |
|---|---|
| Title: | Valence and Conduction Band Offsets of a ZrO2/SiOxNy/n-Si CMOS Gate Stack: A Combined Photoemission and Inverse Photoemission Study |
| Published: | April 02, 2004 |
| Abstract: | |
| Citation: | Physica Status Solidi |
| Volume: | 241 |
| Issue: | 10 |
| Pages: | 7 pp. |
| Research Areas: | Semiconductors |
| PDF version: |  Click here to retrieve PDF version of paper (156KB) |