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Publication Citation: A 10 mK Scanning Probe Microscopy Facility

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Author(s): Young J. Song; Alexander F. Otte; Steven R. Blankenship; Alan H. Band; Frank M. Hess; Young Kuk; Vladimir Shvarts; Zuyu Zhao; Joseph A. Stroscio;
Title: A 10 mK Scanning Probe Microscopy Facility
Published: December 29, 2010
Abstract: We describe the design, development and performance of a scanning probe microscopy (SPM) facility operating at a base temperature of 10 mK in magnetic fields up to 15 T. The microscope is cooled by a custom designed, fully ultra-high vacuum (UHV) compatible dilution refrigerator and is capable of in-situ tip and sample exchange. Sub-picometer stability at the tip-sample junction is achieved through three independent vibration isolation stages and careful design of the dilution refrigerator. The system can be connected to, or disconnected from, a network of interconnected auxiliary UHV chambers for tip/sample preparations and analysis. These include MBE growth chambers for metal and semiconductor samples, a field ion microscope for tip characterization, and a fully independent quick access STM/AFM system. We present cooling performance, noise measurements, and high energy resolution tunneling spectroscopy results on SiC grown epitaxial graphene.
Citation: Review of Scientific Instruments
Volume: 81
Issue: 12
Pages: 33 pp.
Keywords: scanning probe microscopy, scanning tunneling microscopy, cryogenic, dilution refrigerator
Research Areas: Characterization, Nanometrology, and Nanoscale Measurements
PDF version: PDF Document Click here to retrieve PDF version of paper (6MB)