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|Author(s):||John (Jack) W. Ekin;|
|Title:||High-Field Flux Pinning and the Strain Scaling Law|
|Published:||December 01, 1985|
|Abstract:||The effects of strain on flux pinning in superconductors are discussed. Significant differences between the strain scaling law, temperature scaling law, and the flux-line-shearing model of Kramer are demonstrated. The strain scaling law is more general than current flux-pinning models, and as such, it may serve as a guide to future work on flux pinning theory. Flux-pinning measurements at fields up to 24 T have been made on a series of high-quality Nb3Sn samples with third (and fourth) element additions. The data show that the usual extrapolation procedures for determining the bulk average upper critical field in Nb3Sn lead to significant errors when additives such as Ti, Ta, Ga, and Hf are present.|
|Citation:||Proceedings of International Symposium on Flux Pinning and Electromagnetic Properties in Superconductors|
|Pages:||pp. 267 - 271|
|Research Areas:||Electronics & Telecommunications|
|PDF version:||Click here to retrieve PDF version of paper (758KB)|