NIST Authors in Bold
| Author(s): | Ulf Griesmann; Quandou Wang; Eric C. Benck; Jiyoung Chu; Jaewoong Sohn; |
|---|---|
| Title: | Flatness measurements of thin, plane-parallel optics floated on a heavy liquid |
| Published: | June 23, 2010 |
| Abstract: | no abstract |
| Conference: | ASPE 2010 Summer Topical Meeting on Precision Interferometric Metrology |
| Proceedings: | Proceedings ASPE 2010 Summer Topical Meeting on Precision Interferometric Metrology |
| Pages: | pp. 62 - 66 |
| Location: | Ashville, NC |
| Dates: | June 23-25, 2010 |
| Keywords: | interferometry, flatness metrology, heavy liquid |
| Research Areas: | Optical Metrology |
| PDF version: | Click here to retrieve PDF version of paper (1MB) |