Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Stephen E. Russek; D. K. Lathrop; D. H. Shin; Brian H. Moeckly; R A. Buhrman; J. Silcox;|
|Title:||Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links|
|Published:||July 06, 1990|
|Abstract:||The superconductive weak link properties of microbridges formed in c-axis normal YBa 2 Cu 3 O 7 δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak links have current-voltage (I-V) characteristics that are accurately modeled by the resistively shunted junction model. The I-V's are found to accurately follow a simple scaling law with the product of the critical current and weak link resistance Rn varying linearly with the weak link conductance.|
|Citation:||Applied Physics Letters|
|Pages:||pp. 1155 - 1157|
|PDF version:||Click here to retrieve PDF version of paper (623KB)|