| Author(s): |
Stephen E. Russek; D. K. Lathrop; D. H. Shin; Brian H. Moeckly; R A. Buhrman; J. Silcox; |
| Title: |
Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links |
| Published: |
July 06, 1990 |
| Abstract: |
The superconductive weak link properties of microbridges formed in c-axis normal YBa 2 Cu 3 O 7 δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak links have current-voltage (I-V) characteristics that are accurately modeled by the resistively shunted junction model. The I-V's are found to accurately follow a simple scaling law with the product of the critical current and weak link resistance Rn varying linearly with the weak link conductance. |
| Citation: |
Applied Physics Letters |
| Volume: |
57 |
| Pages: |
pp. 1155 - 1157 |
| Research Areas: |
Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (609KB) |
