NIST logo

Publication Citation: Wafer-level Hall Measurement on SiC MOSFET

NIST Authors in Bold

Author(s): Liangchun Yu; Kin P. Cheung; Vinayak Tilak; Greg Dunne; Kevin Matocha; Jason P. Campbell; John S. Suehle; Kuang Sheng;
Title: Wafer-level Hall Measurement on SiC MOSFET
Published: October 11, 2009
Abstract:
Conference: International Conference on Silicon Carbide and Related Materials
Proceedings: Silicon Carbide and Related Materials 2009
Pages: pp. 3 - 4
Location: Nuremberg, -1
Dates: October 11-16, 2009
Research Areas: Semiconductors, Characterization
PDF version: PDF Document Click here to retrieve PDF version of paper (80KB)