| Author(s): |
Liangchun Yu; Kin P. Cheung; Vinayak Tilak; Greg Dunne; Kevin Matocha; Jason P. Campbell; John S. Suehle; Kuang Sheng; |
| Title: |
Wafer-level Hall Measurement on SiC MOSFET |
| Published: |
October 11, 2009 |
| Abstract: |
|
| Conference: |
International Conference on Silicon Carbide and Related Materials |
| Proceedings: |
Silicon Carbide and Related Materials 2009 |
| Pages: |
pp. 3 - 4 |
| Location: |
Nuremberg, -1 |
| Dates: |
October 11-16, 2009 |
| Research Areas: |
Semiconductors, Characterization |
| PDF version: |
 Click here to retrieve PDF version of paper (79KB) |
