Publication Citation
NIST Authors in Bold
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| Author(s): | Liangchun Yu; Kin P. Cheung; Vinayak Tilak; Greg Dunne; Kevin Matocha; Jason P. Campbell; John S. Suehle; Kuang Sheng; |
|---|---|
| Title: | Demonstration of a Wafer-level Hall-Mobility Measurement Technique |
| Published: | December 03, 2009 |
| Abstract: | |
| Pages: | 30 pp. |
| Research Areas: | Semiconductors, Characterization |
| PDF version: |  Click here to retrieve PDF version of paper (86KB) |