NIST Authors in Bold
| Author(s): | Samuel M. Stavis; Jon C. Geist; Michael Gaitan; |
|---|---|
| Title: | Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion |
| Published: | June 08, 2010 |
| Abstract: | |
| Conference: | Hilton Head Workshop 2010: A Solid-State Sensors, Actuators and Microsystems Workshop |
| Proceedings: | Technical Digest of the Hilton Head Workshop 2010 |
| Location: | Hilton Head Island, SC |
| Dates: | June 6-10, 2010 |
| Research Areas: | Nanofabrication, Nanomanufacturing, and Nanoprocessing, Nanofluidics, Characterization, Nanometrology, and Nanoscale Measurements |