Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Joseph J. Kopanski; Ilona Sitnitsky; Vincent LaBella;|
|Title:||Spatial Resolution of Electrical Measurements Performed with Scanning Probe Microscope as a Function of Tip Shape|
|Published:||March 15, 2010|
|Research Areas:||Characterization, Nanometrology, and Nanoscale Measurements|