Publication Citation
NIST Authors in Bold
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| Author(s): | Calvin Chan; Lee J. Richter; David Germack; Brad Conrad; Daniel A. Fischer; Dean M. DeLongchamp; David J. Gundlach; |
|---|---|
| Title: | Spray Deposited Poly-3-hexylthiophene Thin Film Transistors |
| Published: | December 11, 2009 |
| Abstract: | |
| Pages: | 30 pp. |
| Research Areas: | Polymers, Polymers, Semiconductors, Characterization, Electronics, Semiconductor Materials, Atomic force microscopy (AFM), Advanced Materials, Characterization, Nanometrology, and Nanoscale Measurements, Molecular Electronics |