Publication Citation
NIST Authors in Bold
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| Author(s): | Calvin Chan; Lee J. Richter; Cherno Jaye; Brad Conrad; Hyun Wook Ro; David Germack; Daniel A. Fischer; Dean M. DeLongchamp; David J. Gundlach; |
|---|---|
| Title: | Electrical and structural characterization of high performance airbrushed organic thin film transistors |
| Published: | March 18, 2010 |
| Abstract: | |
| Pages: | 30 pp. |
| Research Areas: | Polymers, Characterization, Characterization, Electronics, Processing, Semiconductor Materials, Atomic force microscopy (AFM), Optical microscopy, Advanced Materials |