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NIST Authors in Bold
|Author(s):||Calvin Chan; Lee J. Richter; Cherno Jaye; Brad Conrad; Hyun Wook Ro; David Germack; Daniel A. Fischer; Dean M. DeLongchamp; David J. Gundlach;|
|Title:||Electrical and structural characterization of high performance airbrushed organic thin film transistors|
|Published:||March 18, 2010|
|Research Areas:||Polymers, Characterization, Characterization, Electronics, Processing, Semiconductor Materials, Atomic force microscopy (AFM), Optical microscopy, Advanced Materials|