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Publication Citation: Electrical and structural characterization of high performance airbrushed organic thin film transistors

NIST Authors in Bold

Author(s): Calvin Chan; Lee J. Richter; Cherno Jaye; Brad Conrad; Hyun Wook Ro; David Germack; Daniel A. Fischer; Dean M. DeLongchamp; David J. Gundlach;
Title: Electrical and structural characterization of high performance airbrushed organic thin film transistors
Published: March 18, 2010
Abstract:
Pages: 30 pp.
Research Areas: Polymers, Characterization, Characterization, Electronics, Processing, Semiconductor Materials, Atomic force microscopy (AFM), Optical microscopy, Advanced Materials