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Publication Citation: Electro-optic sampling for traceable high-speed electrical measurements

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Author(s): Paul D. Hale; Dylan F. Williams;
Title: Electro-optic sampling for traceable high-speed electrical measurements
Published: May 23, 2010
Abstract: We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the time and frequency domains. Once calibrated, the photodiode can be used as a known source, providing traceability to both time- and frequency-domain based equipment, including oscilloscopes, vector signal generators, vector signal analyzers, and large signal network analyzers.
Conference: IEEE MTT 2010 International Microwave Symposium Workshop WMF "Ultra-high speed microwave and photonic devices and systems: How will they be tested"
Proceedings: IEEE MTT 2010 International Microwave Symposium
Pages: 1 pp.
Location: Anaheim, CA
Dates: May 23-28, 2010
Keywords: Electro-optic sampling, oscilloscope, photodiode
Research Areas: Electronics & Telecommunications