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NIST Authors in Bold
|Author(s):||Paul D. Hale; Dylan F. Williams;|
|Title:||Electro-optic sampling for traceable high-speed electrical measurements|
|Published:||May 23, 2010|
|Abstract:||We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the time and frequency domains. Once calibrated, the photodiode can be used as a known source, providing traceability to both time- and frequency-domain based equipment, including oscilloscopes, vector signal generators, vector signal analyzers, and large signal network analyzers.|
|Conference:||IEEE MTT 2010 International Microwave Symposium Workshop WMF "Ultra-high speed microwave and photonic devices and systems: How will they be tested"|
|Proceedings:||IEEE MTT 2010 International Microwave Symposium|
|Dates:||May 23-28, 2010|
|Keywords:||Electro-optic sampling, oscilloscope, photodiode|
|Research Areas:||Electronics & Telecommunications|