NIST Authors in Bold
| Author(s): | Ulf Griesmann; John Lehan; Jiyoung Chu; |
|---|---|
| Title: | Power Spectral Density: Is it right? |
| Published: | June 13, 2010 |
| Abstract: | We concentrate on the instrumental issues surrounding power spectral density (PSD) determination, using as an example, the most common optical shop QA tool, the Fizeau interferometer. We briefly discuss the properties of an ideal calibration method for PSD and some of the methods that have been used for this task. Finally, we discuss the method we have been using and some general rules for obtaining better PSD data. |
| Conference: | Optical Fabrication and Testing 2010 |
| Proceedings: | OSA Technical Digest Series |
| Pages: | 3 pp. |
| Location: | Jackson Hole, WY |
| Dates: | June 13-16, 2010 |
| Keywords: | Interferometry; power spectral density |
| Research Areas: | Optical Metrology |
| PDF version: | Click here to retrieve PDF version of paper (162KB) |