NIST Authors in Bold
| Author(s): | Quandou Wang; |
|---|---|
| Title: | A Simple Method to Improve Etching Uniformity when Making Phase Type CGHs on a Thick Glass Substrate |
| Published: | June 13, 2010 |
| Abstract: | A simple method to optimize the etching uniformity when making a Computer generated halogram on a thick optical glass substrate is described, which uses a Teflon ring to enclose the substrate during reactive-ion etching (RIE). |
| Conference: | Optical Fabrication and Testing 2010 |
| Proceedings: | OSA Digest Series |
| Pages: | 3 pp. |
| Location: | Jackson Hole, WY |
| Dates: | June 13-16, 2010 |
| Keywords: | CGH; RIE; EDGE; EFFECT |
| Research Areas: | Optical Metrology |
| PDF version: | Click here to retrieve PDF version of paper (139KB) |