Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Michael S. Gaither; Frank W. DelRio; Richard S. Gates; Edwin R. Fuller; Robert F. Cook;|
|Title:||Strength distribution of single-crystal silicon theta-like specimens|
|Published:||May 18, 2010|
|Abstract:||A new test specimen has been developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test results interpreted using finite element analyses. Fracture strengths reached 3 GPa; fracture initiated at processing-induced flaws.|
|Citation:||Journal of Microelectromechanical Systems|
|Pages:||pp. 422 - 425|
|Keywords:||Finite element analysis (FEA), fracture strength, microelectromechanical systems (MEMS), single-crystal silicon, Weibull statistics|
|Research Areas:||Properties, Ceramics, Materials Science|
|PDF version:||Click here to retrieve PDF version of paper (456KB)|