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|Author(s):||Zhuopeng Tan; Edwin J. Heilweil; Leonid A. Bendersky;|
|Title:||In-situ Kinetics Studies on Hydrogenation of Transition Metal (=Ti, Fe) Doped Mg Films|
|Published:||March 01, 2010|
|Abstract:||In this paper we report on kinetics studies on growth rates of a hydride phase during metal-hydride phase transformation of Mg films doped with transition metals (=Ti, Fe). Infrared imaging of wedge-shaped thin films during hydrogen loading reveals different effects of Ti and Fe additives on Mg hydride growth rates. Compare to hydrogenation of pure Mg, Ti additives (atomic fraction 1.6 % and 2.3 %) do not improve Mg hydride growth rates, however, result in formation of a thicker hydride layer residing on top of the films. Mg Hydrogenation rate is increased by an order of magnitude for additive of atomic fraction 3.1 % of Fe and the thickness of Mg hydride layer is thicker than twice of the hydride layer in hydrogenation of pure Mg case. Results obtained here can be used to guide design of powder for hydrogen storage applications.|
|Proceedings:||Proceedings of 2009 Fall MRS Meeting|
|Dates:||November 29-December 4, 2009|
|Keywords:||kinetics, hydrogenation, thin film, transition metal, Magnesium hydride|
|Research Areas:||Thin-Films, Nanomaterials|
|PDF version:||Click here to retrieve PDF version of paper (287KB)|