Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Structural analysis of multilayer graphene via atomic moiré interferometry

NIST Authors in Bold

Author(s): David L. Miller; Kevin Kubista; Gregory M. Rutter; Ming Ruan; Walt A. de Heer; Phillip First; Joseph A. Stroscio;
Title: Structural analysis of multilayer graphene via atomic moiré interferometry
Published: March 24, 2010
Abstract: The rotation of stacked honeycomb lattices produces an observable moir e pattern in the topography of scanning tunneling microscopy images, which have long been observed in highly-oriented pyrolytic graphite due to rotation of the surface layer relative to layers below. Here, we observe the combined e ect of three-layer moir e patterns in graphene grown on SiC(000 1). Small angle rotations between the first and third layer are shown to produce a double-moir e pattern, resulting from the beat frequencies of interfering moir e patterns of the first three layers. Additionally, unconventional patterns are also observed due to relative lattice strain between the layers. We model the moir e patterns as a beating of the mismatched reciprocal lattice vectors and show how moir e patterns can be used to determine the relative strain between lattices.
Citation: Physical Review B
Volume: 81
Pages: 6 pp.
Keywords: graphene,silicon carbide,scanning tunneling microscopy
Research Areas: Nanoelectronics and Nanoscale Electronics
PDF version: PDF Document Click here to retrieve PDF version of paper (576KB)