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NIST Authors in Bold
|Author(s):||Minhua Zhao; Xiaohong Gu; Sharon E. Lowther; Cheol Park; Jerry Jean; Tinh Nguyen;|
|Title:||Subsurface Characterization of Carbon Nanotubes in Polymer Composites via Quantitative Electric Force Microscopy|
|Published:||February 03, 2010|
|Abstract:||In this study, quantitative Electric Force Microscopy (EFM) characterization of CNTs dispersed in free-standing polymer composite films is pursued. The effect of experimental parameters including humidity conditions, EFM probe geometry, tip-sample distance, and bias voltage on the EFM contrast is studied. A new mechanism for subsurface EFM contrast of CNTs is proposed based on the experimental findings. We anticipate that quantitative EFM technique will be a powerful tool for subsurface characterization of high dielectric nanostructures in low dielectric materials, with a broad range of applications in nanotechnology.|
|Keywords:||Electric Force Microscopy, EFM, SPM, subsurface, carbon nanotube, CNT, polymer composites|
|Research Areas:||Materials Science, Characterization, Nanometrology, and Nanoscale Measurements|