| Author(s): |
Dazhen Gu; David K. Walker; James P. Randa; |
| Title: |
Noise-Parameter Measurements with a Reflection Type Phase Shifter |
| Published: |
November 01, 2010 |
| Abstract: |
We report a miniaturized phase shifter operating in the frequency range from 5 GHz to 7 GHz for noise-parameter extraction. Such a tunable solid-state unit represents a significant reduction in the size and mass as a source-pull component, compared to its mechanical counterparts. It provides adequate impedance coverage, ultra-fast response, as well as high repeatability, across the designed region. A packaged low noise amplifier was measured at integer frequencies (5 GHz, 6 GHz, and 7 GHz) by use of the phase shifter on the NIST NFRad system. The measured results exhibited good accuracy. The combined uncertainties (Type-A and Type-B) are below 6 % for both the minimum noise temperature and the magnitude of the optimum input reflection coefficient. |
| Citation: |
Microwave and Optical Technology Letters |
| Volume: |
52 |
| Issue: |
11 |
| Pages: |
pp. 2600 - 2603 |
| Keywords: |
Amplifier noise parameters; noise measurement; phase shifter; source pull technique; uncertainty analysis |
| Research Areas: |
Electronics & Telecommunications, Measurement Solutions |
| PDF version: |
 Click here to retrieve PDF version of paper (554KB) |
