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|Author(s):||Dazhen Gu; David K. Walker; James P. Randa;|
|Title:||Noise-Parameter Measurements with a Reflection Type Phase Shifter|
|Published:||November 01, 2010|
|Abstract:||We report a miniaturized phase shifter operating in the frequency range from 5 GHz to 7 GHz for noise-parameter extraction. Such a tunable solid-state unit represents a significant reduction in the size and mass as a source-pull component, compared to its mechanical counterparts. It provides adequate impedance coverage, ultra-fast response, as well as high repeatability, across the designed region. A packaged low noise amplifier was measured at integer frequencies (5 GHz, 6 GHz, and 7 GHz) by use of the phase shifter on the NIST NFRad system. The measured results exhibited good accuracy. The combined uncertainties (Type-A and Type-B) are below 6 % for both the minimum noise temperature and the magnitude of the optimum input reflection coefficient.|
|Citation:||Microwave and Optical Technology Letters|
|Pages:||pp. 2600 - 2603|
|Keywords:||Amplifier noise parameters, noise measurement, phase shifter, source pull technique, uncertainty analysis|
|Research Areas:||Electronics & Telecommunications, Measurement Solutions|
|PDF version:||Click here to retrieve PDF version of paper (567KB)|