NIST Authors in Bold
| Author(s): | Hao Xiong; Wenyong Wang; John S. Suehle; Curt A. Richter; W. Hong; T. Lee; |
|---|---|
| Title: | Noise in ZnO Nanowire Field Effect Transistors |
| Published: | February 05, 2009 |
| Abstract: | |
| Conference: | International Conference on Nanoscience & Technology, China 2007 |
| Proceedings: | Journal of Nanoscience and Nanotechnology |
| Volume: | 9 |
| Issue: | 4 |
| Pages: | pp. 1041 - 1044 |
| Location: | Beijing, -1 |
| Dates: | June 3-7, 2007 |
| Research Areas: | Semiconductor Materials, Nanoelectronics and Nanoscale Electronics |