NIST Authors in Bold
| Author(s): | Qiliang Li; Xiaoxiao Zhu; D. Ioannou; John S. Suehle; Curt A. Richter; |
|---|---|
| Title: | Steep Subthreshold Slope Nanowire FETs with Gate-Induced Schottky-Barrier Tunneling |
| Published: | June 24, 2009 |
| Abstract: | |
| Conference: | 2009 Device Research Conference |
| Proceedings: | 2009 Device Research Conference Technical Digest |
| Pages: | pp. 113 - 114 |
| Location: | University Park, PA |
| Dates: | June 22-24, 2009 |
| Research Areas: | Semiconductor Materials |