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Transport Characterization in Nanowires Using an Electrical Nanoprobe

Published

Author(s)

Albert A. Talin, Francois Leonard, Brian Swartzentruber, Samuel T. Picraux, Maria Eugenia Toimil-Molares, Jeffrey Cederberg, Xiaorui Wang, Stephen Hursee, A. Rishinaramangalum

Abstract

Abstract on original Form 114
Citation
Semiconductor Science and Technology
Volume
25

Keywords

semiconductor, nanowire, contacts, nanoprobe, space, charge, limited, conduction

Citation

Talin, A. , Leonard, F. , Swartzentruber, B. , Picraux, S. , , M. , Cederberg, J. , , X. , Hursee, S. and Rishinaramangalum, A. (2010), Transport Characterization in Nanowires Using an Electrical Nanoprobe, Semiconductor Science and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903897 (Accessed March 28, 2024)
Created January 22, 2010, Updated February 19, 2017