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Publication Citation: Comparison of the INMETRO and NIST Josephson Voltage Standards (part of the ongoing regional key comparison SIM.EM.BIPM-K10.b1)

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Author(s): Yi-hua Tang; Regis P. Landim; Afonso Edson; Victor Ferreira;
Title: Comparison of the INMETRO and NIST Josephson Voltage Standards (part of the ongoing regional key comparison SIM.EM.BIPM-K10.b1)
Published: October 10, 2009
Abstract: A direct comparison of the 10 V Josephson Voltage Standards (JVS) of the National Institute of Standards and Technology (NIST), USA and the National Institute of Metrology, Standardization and Industrial Quality (INMETRO), Brazil was made in June 2009. The process consisted of two comparisons, first using the NIST CJVS s measuring system (hardware and software) to measure 10 V reference voltage provided by the INMETRO JVS and then using the INMETRO JVS s measuring system to measure the 10 V reference voltage provided by the NIST CJVS. The results of the two comparisons were in agreement to within 1.1 nV and their mean indicated that the difference between the two JVSs at 10 V was 0.54 nV with a combined standard uncertainty of 1.48 nV or a relative standard uncertainty of 1.48 parts in 10^10.
Citation: Metrologia
Pages: 18 pp.
Keywords: CIPM-MRA key comparison; direct comparison; Josephson voltage standard; uncertainty
Research Areas: Quantum Electrical Measurements, Measurements
PDF version: PDF Document Click here to retrieve PDF version of paper (456KB)