Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||John A. Horst;|
|Title:||Interoperability and the DMIS experience|
|Published:||October 30, 2009|
|Abstract:||Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and suppliers commonly ask, namely, what are information exchange standards, what is true (and false) interoperability, what's the return on investment (ROI) for information exchange standards, what is required to achieve the maximum ROI, and what are the pitfalls and common criticisms of information exchange standards. As we offer answers to these questions, we will give illustration through the experience of working on the Dimensional Measurement Interface Standard (DMIS).|
|Keywords:||Interoperability, Manufacturing, Quality Information, DMIS, Dimensional Metrology, Information Exchange Standards, Manufacturing Quality|
|Research Areas:||Metrology and Standards for Manufacturing Processes, Metrology and Standards for Manufacturing Equipment, Metrology and Standards for Manufacturing Systems and Data, Systems Integration, Conformance Testing, Manufacturing, Metrology|