Chen-Mayer, H.
, Lamaze, G.
, Coakley, K.
and Satija, S.
(2003),
Two Aspects of Thin Film Analysis: Boron Profile and Scattering Length Density Profile, Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
(Accessed April 25, 2024)
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Two Aspects of Thin Film Analysis: Boron Profile and Scattering Length Density Profile
Published
Author(s)
, , ,
Citation
Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
Volume
505
Issue
1
Pub Type
Journals
Citation
Created May 31, 2003, Updated October 12, 2021