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|Author(s):||Elisabeth Mansfield; Roy H. Geiss; Jeffrey A. Fagan;|
|Title:||Methods for TEM analysis of NIST s single-walled carbon nanotube Standard Reference Material|
|Published:||August 20, 2009|
|Abstract:||The National Institute of Standards and Technology (NIST) is releasing a series of single-walled carbon nanotube Standard Reference Materials (SRMs) to provide consumers with a well-characterized material for their applications. The SWCNT Reference Material will be introduced as a series of three types of material: 1) raw soot characterized for composition, 2) purified (> 90% SWCNT) bucky paper and 3) dispersed, length sorted populations characterized by length. A selection of dispersing solvents, including organic solvents, aqueous surfactants and DNA dispersions, were prepared and examined by transmission electron microscopy (TEM). Recommendations for sample preparation of the SWCNT SRM 2483 to yield similar structures are given. Examples of images of the length sorted SWCNT reference material are also shown.|
|Conference:||SPIE Optics and Photonics, Nano Science and Engineering|
|Proceedings:||SPIE Proceedings, Nano Science and Engineering 2009|
|Pages:||pp. 74050A-1 - 74050A-11|
|Location:||San Diego, CA|
|Dates:||August 2-6, 2009|
|Keywords:||Single-walled carbon nanotubes, TEM, Standard Reference Material|
|Research Areas:||Nanomaterials, Materials Science|
|PDF version:||Click here to retrieve PDF version of paper (10MB)|