NIST Authors in Bold
| Author(s): | Nien F. Zhang; |
|---|---|
| Title: | Linking the Results of CIPM and RMO Key Comparisons with Linear Trends |
| Published: | June 30, 2010 |
| Abstract: | A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparisons have the same nominal values or of a same magnitude. The degrees of equivalence between the pairs of national metrology institutes, of which both only participates in one of the two comparisons, and their corresponding uncertainties are established. The approach is applied to link CCEM-K2 and SIM.EM-K2 comparisons at 1 G Ω level. |
| Citation: | Journal of Research (NIST JRES) - |
| Volume: | 115 |
| Issue: | 3 |
| Pages: | pp. 179 - 194 |
| Keywords: | degrees of equivalence; generalized least square estimator; key comparison reference value; national metrology institute; uncertainty; weighted mean |
| Research Areas: | Statistics |
| PDF version: | Click here to retrieve PDF version of paper (231KB) |