| Author(s): |
Guangjun Gao; John Lehan; Ulf Griesmann; |
| Title: |
Dual-CGH Interferometry Test for X-Ray Mirror Mandrels |
| Published: |
June 15, 2008 |
| Abstract: |
We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are described. The application illustrates the advantage of dual-CGH tests for the complete metrology of precise optical surfaces. |
| Conference: |
SPIE Europe Optical Metrology |
| Proceedings: |
Optical Measurement Systems for Industrial Inspection |
| Volume: |
7389 |
| Pages: |
pp. 73891B-1 - 73891B-5 |
| Location: |
Muenchen, -1 |
| Dates: |
June 15-18, 2009 |
| Keywords: |
Interferometry; optical test; computer-generated hologram; x-ray telescope optics |
| Research Areas: |
Optical Metrology |
| PDF version: |
 Click here to retrieve PDF version of paper (1MB) |
