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NIST Authors in Bold
|Author(s):||Guangjun Gao; John Lehan; Ulf Griesmann;|
|Title:||Dual-CGH Interferometry Test for X-Ray Mirror Mandrels|
|Published:||June 15, 2008|
|Abstract:||We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are described. The application illustrates the advantage of dual-CGH tests for the complete metrology of precise optical surfaces.|
|Conference:||SPIE Europe Optical Metrology|
|Proceedings:||Optical Measurement Systems for Industrial Inspection|
|Pages:||pp. 73891B-1 - 73891B-5|
|Dates:||June 15-18, 2009|
|Keywords:||Interferometry, optical test, computer-generated hologram, x-ray telescope optics|
|Research Areas:||Optical Metrology|
|PDF version:||Click here to retrieve PDF version of paper (1MB)|