| Author(s): |
Raghu N. Kacker; Ruediger Kessel; Klaus-Dieter Sommer; Xin Bian; |
| Title: |
Metrological Compatibility and Statistical Consistency |
| Published: |
September 05, 2010 |
| Abstract: |
The traditional concept of consistency in multiple evaluations of the same measurand is statistical. The statistical view of consistency does not match the modern view of uncertainty in measurement; in particular, it does not apply to the results of measurement expressed as measured values with standard uncertainties. Therefore, the International Vocabulary of Metrology, 3rd ed (VIM3) introduced the concept of metrological compatibility of multiple results of measurement for the same measurand. We prefer the term metrological consistency for the VIM3 concept of metrological compatibility. This paper discusses the differences between the two concepts of consistency |
| Proceedings: |
Proceedings of the Tenth International Symposium on Measurement and Quality Control, |
| Location: |
Osaka, |
| Dates: |
September 5-9, 2010 |
| Keywords: |
interlaboratory evaluations, uncertainty in measurement, metrolgogical compatibility, statistical consistecy |
| Research Areas: |
Math |
| PDF version: |
 Click here to retrieve PDF version of paper (125KB) |
