| Author(s): |
Jun Y. Chung; Adam J. Nolte; Christopher M. Stafford; |
| Title: |
Surface Wrinkling: a Versatile Platform for Measuring Thin Film Properties |
| Published: |
September 02, 2010 |
| Abstract: |
Surface instabilities in soft matter have captivated the scientific community for decades. Recently, surface wrinkling has received a great deal of attention due to its simplicity and well-established mechanics of formation. Particularly, the use of surface wrinkling as a measurement platform for material properties has gained widespread momentum in the material science community. In this article, we will review several applications of surface wrinkling for the measurement of thin film mechanical properties, highlighting particularly challenging materials systems such as ultrathin films, polymer brushes, polyelectrolyte multilayer assemblies, and ultrasoft materials. We will also offer a perspective on the future directions of this maturing field, both as a metrology for material properties as well as a route for robust surface patterning. |
| Citation: |
Advanced Materials |
| Volume: |
23 |
| Issue: |
3 |
| Pages: |
pp. 349 - 368 |
| Keywords: |
instabilities; surface wrinkling; metrology; thin films; polymer; modulus |
| Research Areas: |
Polymers, Combinatorial Methods, Characterization, Nanomaterials, Advanced Materials |
| PDF version: |
 Click here to retrieve PDF version of paper (2MB) |
