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NIST Authors in Bold
|Author(s):||Vincent A. Hackley; Martin Fritts; James F. Kelly; Anil K. Patri; Alan F. Rawle;|
|Title:||ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION|
|Published:||August 13, 2009|
|Abstract:||A two-day international workshop was convened recently in order to scope out and address the urgent need for standards to accurately characterize the physico-chemical and biological properties of engineered nanomaterials. These standards are needed by industry and regulatory bodies in order to meet requirements for the production, application and lifecycle risk management of nanomaterial-based products ranging from cancer therapeutics to high-tech coatings and composites. The current deficiency in the availability of such standards, including both documentary and reference artifacts, is perceived as limiting the widespread adoption and implementation of nanoscale technologies. Herein is given a brief summary of that workshop, its findings and recommendations.|
|Citation:||INFOSIM INFORMATIVE BULLETIN OF THE INTERAMERICAN METROLOGY SYSTEM|
|Pages:||pp. 24 - 29|
|Keywords:||nanotechnology, standards, nanomaterial, nanobiotechnology, metrology|
|Research Areas:||Characterization, Nanometrology, and Nanoscale Measurements|