Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||David Germack; Calvin Chan; Behrang H. Hamadani; Lee J. Richter; Daniel A. Fischer; David J. Gundlach; Dean M. DeLongchamp;|
|Title:||Substrate-dependent interface composition and charge transport in films for organic photovoltaics|
|Published:||June 09, 2009|
|Abstract:||The buried interface composition of polymer-fullerene blends is found by near edge X ray absorption fine structure (NEXAFS) spectroscopy to depend on the surface energy of the substrate upon which they are cast. The interface composition determines the type of charge transport measured with thin film transistors. These results have implications for organic photovolatics device design and the use of transistors to evaluate bulk mobility in blends.|
|Citation:||Applied Physics Letters|
|Keywords:||photovoltaic, heterojunction, polythiophene, fullerene, nexafs, solar cell|
|PDF version:||Click here to retrieve PDF version of paper (256KB)|