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|Author(s):||Catherine A. Remley;|
|Title:||Practical Applications of Nonlinear Measurements|
|Published:||June 12, 2009|
|Abstract:||We discuss the limitations of vector network analyzers in the measurement of nonlinear devices and circuits, including their inability to measure the relative phase between frequency components and the actual impedance in which a device is embedded. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.|
|Proceedings:||73rd ARFTG Microwave Measurement Symposium|
|Pages:||pp. 1 - 15|
|Dates:||June 12, 2009|
|Keywords:||Linear measurements, Measurement-based Model, Nonlinear measurements, Nonlinear vector network analyzer, Vector network analyzer|
|DOI:||http://dx.doi.org/10.1109/ARFTG.2009.5278060 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (13MB)|