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NIST Authors in Bold
|Author(s):||John G. Gillen; David S. Simons; P. Williams;|
|Title:||Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds|
|Published:||January 01, 1990|
|Abstract:||An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynuclear aromatic hydrocarbon which were deposited onto copper transmition electron microscope grids. All images were generated by using the secondary ion signal of the parent molecular species|
|Pages:||pp. 2122 - 2130|
|Research Areas:||Nanotechnology, Chemistry|