Publication Citation
NIST Authors in Bold
 |
| Author(s): | John G. Gillen; Debra L. Kaiser; Jay S. Wallace; |
|---|---|
| Title: | Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors |
| Published: | January 01, 1991 |
| Abstract: | |
| Citation: | Surface and Interface Analysis |
| Volume: | 17 |
| Issue: | 1 |
| Pages: | pp. 7 - 14 |
| Research Areas: | Nanotechnology, Chemistry |