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Publication Citation: Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors

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Author(s): John G. Gillen; Debra L. Kaiser; Jay S. Wallace;
Title: Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors
Published: January 01, 1991
Abstract:
Citation: Surface and Interface Analysis
Volume: 17
Issue: 1
Pages: pp. 7 - 14
Research Areas: Nanotechnology, Chemistry